Fluorescent Magnetic Particle Inspection Device Based on Digital Image Processing

被引：0
作者：
Luo, Jianlan [1 ,2 ]
Tian, Zhewen [1 ,2 ]
Yang, Jintao [1 ]
机构：
[1] Wuhan Univ Technol, Sch Automot Engn, Wuhan 430070, Peoples R China
[2] Hubei Key Lab Adv Technol Automot Parts, Wuhan 430070, Peoples R China
来源：
2014 11TH WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION (WCICA) | 2014年
关键词：
Fluorescent magnetic particle inspection; digital image processing; wavelet-based Canny Operator;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Fluorescent magnetic particle inspection is widely applied in industry production, however; traditional ways are manual and depend on individuals' experience, which can also cause damage to workers' eyes. An automatic fluorescent magnetic particle inspection device is presented in this paper. A series of image processing methods have been investigated, which are put into a combination for detecting flaws in images automatically. And we propose a wavelet-based Canny operator to extract outlines of flaws in images, which is more effective than common Canny operator, and could constrain noises at a reasonable level. Results suggest that this novel automatic inspection device offers a low labor intensity but more effective way for flaw detection work, and image processing methods proposed in this paper are feasible.
引用
收藏
页码：5677 / 5681
页数：5
相关论文
共 10 条
  • [1] Aarti D, 2012, 2012 1 INT C 19 21 D, P1
  • [2] Bakunov A S., 2012, RUSSIAN J NONDESTRUC, P170
  • [3] An Adaptive Median Filter for Image Denoising
    Chang, Chin-Chen
    Hsiao, Ju-Yuan
    Hsieh, Chih-Ping
    [J]. 2008 INTERNATIONAL SYMPOSIUM ON INTELLIGENT INFORMATION TECHNOLOGY APPLICATION, VOL II, PROCEEDINGS, 2008, : 346 - +
  • [4] Cheng Ze., 2011, POWER ENERGY ENG C A, P1, DOI [DOI 10.1109/APPEEC.2011.5749018, 10.1109/IMTC.2011.5944294, DOI 10.1109/IMTC.2011.5944294]
  • [5] A discrete expression of Canny's criteria for step edge detector performances evaluation
    Demigny, D
    Kamle, T
    [J]. IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1997, 19 (11) : 1199 - 1211
  • [6] Hao H W., 2011, NONDESTRUCTIVE TESTI, V8, P442
  • [7] Jiles D. C, 2002, IEEE T MAGN, V26, P2577
  • [8] John F P., 2000, NONDESTRUCTIVE TESTI, V22, P522
  • [9] Tamotsu N., 2009, IEEE T NONDESTRUCTIV, V15, P1558
  • [10] Vervaeke K, 2013, P 3 INT C EL DRIV PR, P1
1