Thickness Dependent Structural and Magnetic Properties of Fe-Co-Si-B Thin Films

被引:0
|
作者
Umadevi, K. [1 ,2 ]
Chelvane, J. Arout [1 ]
Jayalakshmi, V. [2 ]
机构
[1] Def Met Res Lab, Hyderabad 500085, Telangana, India
[2] Natl Inst Technol Warangal, Dept Phys, Warangal, Andhra Prades, India
关键词
D O I
10.1063/1.5032962
中图分类号
O59 [应用物理学];
学科分类号
摘要
Effect of film thickness on the magnetic behavior of Fe-Co-Si-B thin films has been studied. Structural studies showed a transition from amorphous to partial crystallization with increase in film thicknesses. Magnetization measurements demonstrated presence of strong in-plane magnetic anisotropy for all the films. Angular dependent hysteresis measurements indicated presence of weak magnetic anisotropy at lower thicknesses. Transformation from weak to uni-axial in-plane magnetic anisotropy has been observed with increase in film thicknesses owing to partial crystallization and enhanced stresses.
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页数:4
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