Measurement of coating thickness non-uniformity of photosensitive film in production process

被引：0

作者：

Inoue, N ^{[1
]}

Aoshima, N ^{[1
]}

机构：

[1] Mitsubishi Papermills Ltd, Tsukuba, Ibaraki, Japan

来源：

SICE 2003 ANNUAL CONFERENCE, VOLS 1-3 | 2003年

关键词：

photo layer; thickness measurement; light reflection;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

In photo material industry, the check of quality about surface of photosensitive layer is very important. If there is uneven thickness failure in photo layer, it may cause a shadow or a stripe. In these days, a laser deposit analyzer is available that lights laser spot on material and measures reflection. It has reliability for detecting a pinhole or other sharp deposit like bull's eye, but it is difficult to detect uneven thickness in photo layer. In this report, a method of analyzing uneven thickness like stripes on photo layer or other deposits is described. We tested many methods of photo surface inspection. Finally, we chose light reflection method and constructed a test system of photo layer surface inspection equipment that can be built in or added on to photo material factory machines. The constructed equipment proved to be less sensitive to mechanical noises and low cost of building and running.

引用

页码：15 / 19

页数：5