X-ray phase contrast imaging at MAMI

被引:7
作者
El-Ghazaly, M. [1 ]
Backe, H. [1 ]
Lauth, W. [1 ]
Kube, G. [1 ]
Kunz, P. [1 ]
Sharafutdinov, A. [1 ]
Weber, T. [1 ]
机构
[1] Univ Mainz, Inst Kernphys, D-55099 Mainz, Germany
关键词
D O I
10.1140/epja/i2006-09-021-6
中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
Experiments have been performed to explore the potential of the low emittance 855 MeV electron beam of the Mainz Microtron MAMI for imaging with coherent X-rays. Transition radiation from a micro-focused electron beam traversing a foil stack served as X-ray source with good transverse coherence. Refraction contrast radiographs of low absorbing materials, in particular polymer strings with diameters between 30 and 450 pin, were taken with a polychromatic transition radiatiori X-ray source with a spectral distribution in the energy range between 8 and about 40 keV. The electron beam spot size had standard deviation sigma(h) = (8.6 +/- 0. 1) pin in the horizontal and sigma(v) = (7.5 +/- 0. 1) ILm in the vertical direction. X-ray films were used as detectors. The source-to-detector distance amounted to 11.4 in. The objects were placed in a distance of up to 6 in from the X-ray film. Holograms of strings were taken with a beam spot size sigma(v) = (0.50 +/- 0.05) mu m in vertical direction, and a monochromatic X-ray beam of 6 keV energy. A good longitudinal coherence has been obtained by the (111) reflection of a flat silicon single crystal in Bragg geometry. It has been demonstrated that a direct exposure CCD chip with a pixel size of 13 x 13 mu m(2) provides a highly efficient on-line detector. Contrast images can easily be generated with a complete elimination of all parasitic background. The on-line capability allows a minimization of the beam spot, size by observing the smallest visible interference fringe spacings or the number of visible fringes. It has been demonstrated that X-ray films are also very useful detectors. The main advantage in comparison with the direct exposure CCD chip is the resolution. For the Structurix D3 (Agfa) X-ray film the standard deviation of the resolution was measured to be sigma(f) = (1.2 +/- 0.4) mu m, which is about a factor of 6 better than for the direct exposure CCD chip. With the small effective X-ray spot size in vertical direction of sigma(v) = (1.2 +/- 0.3) mu m and a geometrical magnification of up to 7.4 high-quality holograms of tiny transparent strings were taken in which the holographic information is contained in up to 18 interference fringes.
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页码:197 / 208
页数:12
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