On New Approaches in Data Base Formation of Identification Marks Obtained by the Electrodischarge Method

被引:0
作者
Shkilev, V. D. [1 ]
Adamchuk, A. N. [1 ]
机构
[1] Minist Informat Dev Moldova Republ, MD-2012 Kishinev, Moldova
关键词
Phase Portrait; Apply Electrochemistry; Surface Engineer; Numerical Code; Phase Approach;
D O I
10.3103/S106837550902001X
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Ways of protection of identification marks obtained by the electrodischarge method on the basis of the Cartesian, spectral, and phase picture approaches have been offered. It has been shown that a sufficiently reliable level of protection can be attained at a mark processing time duration on the order of five seconds.
引用
收藏
页码:81 / 84
页数:4
相关论文
共 4 条
  • [1] FEYNMAN, 1964, FEYNMAN LECT PHYS EL, V5, P174
  • [2] PODLIPCHUK V, 1990, TEOR MAT FIZ, V82, P208
  • [3] SHKILEV VD, 2007, Patent No. 3389
  • [4] SHKILEV VD, 2008, SURF ENG APPL ELECTR, P4