Differential charging in XPS .1. Demonstration of lateral charging in a bulk insulator using imaging XPS

被引:0
|
作者
Tielsch, BJ [1 ]
Fulghum, JE [1 ]
机构
[1] KENT STATE UNIV,DEPT CHEM,KENT,OH 44242
关键词
D O I
10.1002/(SICI)1096-9918(199606)24:6<422::AID-SIA142>3.0.CO;2-G
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Recent literature has drawn a distinction between charging across the surface (lateral differential charging) and charging with depth (vertical differential charging) for insulating samples. In this study, differential charging in a bulk insulator was investigated using imaging and small-area spectra acquired with a monochromatic x-ray source. With no charge neutralization, reproducible photoelectron images and spectra could be acquired from a glass sample after similar to 90 min of x-ray exposure. The charge shifts and photoelectron peak shapes vary as a function of x-ray flux on the sample, indicating that lateral charging is the dominant mechanism on a hulk insulator. Uniform binding energies, photoelectron peak shapes and images are acquired with the charge neutralizer on.
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页码:422 / 427
页数:8
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