An 8bit, 2.6ps Two-Step TDC in 65 CMOS Employing a Switched Ring-Oscillator Based Time Amplifier

被引：11

作者：

Kim, Bongjin ^{[1
,2
]}

Kim, Hoonki ^{[1
]}

Kim, Chris H. ^{[1
]}

机构：

[1] Univ Minnesota, Minneapolis, MN 55455 USA

[2] Rambus Inc, Sunnyvale, CA 94089 USA

来源：

2015 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC) | 2015年

关键词：

D O I：

10.1109/CICC.2015.7338425

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An 8bit two-step time-to-digital converter (TDC) with a novel digital switched ring-oscillator based time amplifier (TA) is demonstrated in 65nm CMOS. The proposed TA achieves a predictable and programmable gain without requiring any calibration. The implemented 8bit two-step TDC with a 16x TA gain achieves a time resolution of 2.6ps at 80MS/s conversion rate while consuming 2mW. The measured DNL and INL arc 1.84LSB and 2.36LSB, respectively. The TDC area is 0.07mm(2).

引用

页数：4

共 6 条

[1] Analysis and Design of Voltage-Controlled Oscillator Based Analog-to-Digital Converter [J].

Kim, Jaewook ;

Jang, Tae-Kwang ;

Yoon, Young-Gyu ;

Cho, SeongHwan .

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2010, 57 (01) :18-30

[2]

KwangSeok Kim, 2012, 2012 IEEE Symposium on VLSI Circuits, P192, DOI 10.1109/VLSIC.2012.6243855

[3] A 9b, 1.25ps resolution coarse-fine time-to-digital converter in 90nm CMOS that amplifies a time residue [J].

Lee, Miniae ;

Abidi, Asad A. .

2007 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS, 2007, :168-169

[4] IMAGE TAG REFINEMENT ALONG THE 'WHAT' DIMENSION USING TAG CATEGORIZATION AND NEIGHBOR VOTING [J].

Lee, Sihyoung ;

De Neve, Wesley ;

Ro, Yong Man .

2010 IEEE INTERNATIONAL CONFERENCE ON MULTIMEDIA AND EXPO (ICME 2010), 2010, :48-53

[5] Time to Digital Converter based on a 2-dimensions Vernier architecture [J].

Liscidini, Antonio ;

Vercesi, Luca ;

Castello, Rinaldo .

PROCEEDINGS OF THE IEEE 2009 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2009, :45-48

[6] A 1.25 ps Resolution 8b Cyclic TDC in 0.13 μm CMOS [J].

Seo, Young-Hun ;

Kim, Jun-Seok ;

Park, Hong-June ;

Sim, Jae-Yoon .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2012, 47 (03) :736-743

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