Self-referencing dispersion characterization of multimode structures using direct instantaneous frequency measurement

被引：6
作者：
Dorrer, C [1 ]
Ramachandran, S
机构：
[1] Bell Labs, Lucent Technol, Holmdel, NJ 07733 USA
[2] OFS Labs, Murray Hill, NJ 07974 USA
来源：
IEEE PHOTONICS TECHNOLOGY LETTERS | 2004年 / 16卷 / 07期
关键词：
dispersive media; interferometry; multimode transmission lines; optical fiber communication; optical fiber measurement;
D O I：
10.1109/LPT.2004.828353
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A technique for the simultaneous self-referencing characterization of the chromatic dispersion of the modes of a multimode structure is presented. The frequency-dependent group delay of each mode is extracted independently using Fourier processing of the temporal and spectral intensities measured after propagation of a short pulse in the structure under test and an interferometer. As an experimental demonstration, we have characterized the chromatic dispersion of the two modes of a fiber typically used for constructing high-order mode dispersion-compensating modules.
引用
收藏
页码：1700 / 1702
页数：3
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