Scaling of dark count rate with active area in 1.06 μm photon-counting InGaAsP/InP avalanche photodiodes

被引：11

作者：

Dauler, E. A. ^{[1
]}

Hopman, P. I. ^{[1
]}

McIntosh, K. A. ^{[1
]}

Donnelly, J. P. ^{[1
]}

Duerr, E. K. ^{[1
]}

Magliocco, R. J. ^{[1
]}

Mahoney, L. J. ^{[1
]}

Molvar, K. M. ^{[1
]}

Napoleone, A. ^{[1
]}

Oakley, D. C. ^{[1
]}

O'Donnell, F. J. ^{[1
]}

机构：

[1] MIT, Lincoln Lab, Lexington, MA 02420 USA

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 11期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1063/1.2243800

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Reducing the active area of InGaAsP/InP avalanche photodiodes operated in Geiger mode is investigated for reducing the dark count rate. The dark count rate in Geiger mode is found to scale linearly with the detector's active area for mesa diameters of 10, 15, and 20 mu m. Scaling the mesa size from 20 to 10 mu m results in a reduction of the room-temperature dark count rate from 290 to 44 kHz at similar to 4.5 V of overbias, while the photon detection efficiency is similar to 45% for all device diameters. The trade-offs associated with shrinking the active area, including reduced optical coupling and higher on-state resistance, are discussed briefly. (c) 2006 American Institute of Physics.

引用

页数：3

共 9 条

[1]

Aull B. F., 2002, Lincoln Laboratory Journal, V13, P335

[2] A high-performance integrated single-photon detector for telecom wavelengths [J].