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Characterization of homoepitaxial diamond by Raman spectroscopy
被引:0
|
作者
:
Saito, H
论文数:
0
引用数:
0
h-index:
0
机构:
Sumitomo Elect Ind Ltd, Itami Res Lab, Itami, Hyogo 6640016, Japan
Sumitomo Elect Ind Ltd, Itami Res Lab, Itami, Hyogo 6640016, Japan
Saito, H
[
1
]
Imai, T
论文数:
0
引用数:
0
h-index:
0
机构:
Sumitomo Elect Ind Ltd, Itami Res Lab, Itami, Hyogo 6640016, Japan
Sumitomo Elect Ind Ltd, Itami Res Lab, Itami, Hyogo 6640016, Japan
Imai, T
[
1
]
机构
:
[1]
Sumitomo Elect Ind Ltd, Itami Res Lab, Itami, Hyogo 6640016, Japan
来源
:
NEW DIAMOND AND FRONTIER CARBON TECHNOLOGY
|
1999年
/ 9卷
/ 02期
关键词
:
diamond;
homoepitaxial growth;
Raman spectroscopy;
internal stress;
D O I
:
暂无
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:122 / 122
页数:1
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