Electric-Field Gradients derived from CCD X-ray Diffraction Data in Silicates: the cases of 27Al in Al2SiO5 Polymorphs and 25Mg in Mg2SiO4 Forsterite

被引：0
|
作者：
Ghermani, N. E. [1 ]
Dahaoui, S. [1 ]
Ghose, S. [2 ]
Howard, J. A. K. [3 ]
机构：
[1] Univ Nancy 1, Fac Sci, Lab Cristallog & Modelisat Mat Mineraux & Biol, UPRES A,CNRS 7036, F-54506 Vandoeuvre Les Nancy, France
[2] Univ Washington, Dept Geol Sci, Mineral Phys Grp, Seattle, WA 98195 USA
[3] Univ Durham, Dept Chem, Crystallog Grp, Durham DH1 3LE, England
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2000年 / 56卷
关键词：
EFG; CCD; silicates;
D O I：
10.1107/S010876730002763X
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
s11.m1.p12
引用
收藏
页码：S364 / S364
页数：1
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