Band anticrossing in GaNxSb1-x

被引:50
作者
Jefferson, P. H.
Veal, T. D.
Piper, L. F. J.
Bennett, B. R.
McConville, C. F. [1 ]
Murdin, B. N.
Buckle, L.
Smith, G. W.
Ashley, T.
机构
[1] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[2] Univ Surrey, Sch Elect & Phys Sci, Guildford GU2 5XH, Surrey, England
[3] QinetiQ Ltd, Malvern WR14 3PS, Worcs, England
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1063/1.2349832
中图分类号
O59 [应用物理学];
学科分类号
摘要
Fourier transform infrared absorption measurements are presented from the dilute nitride semiconductor GaNSb with nitrogen incorporations between 0.2% and 1.0%. The divergence of transitions from the valence band to E- and E+ can be seen with increasing nitrogen incorporation, consistent with theoretical predictions. The GaNSb band structure has been modeled using a five-band k center dot p Hamiltonian and a band anticrossing fitting has been obtained using a nitrogen level of 0.78 eV above the valence band maximum and a coupling parameter of 2.6 eV. (c) 2006 American Institute of Physics.
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页数:3
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