Standard-based direct calibration method for scanning thermal microscopy nanoprobes

A direct calibration method, which is based on international temperature standards, developed for scanning thermal microscopy (SThM) nanoprobes is presented. The idea of calibration is intended mostly for use with thermoresistive SThM nanoprobes and is based on referencing the tip resistance to melting or freezing points of materials, which are contacted directly by the SThM tip. Particularly, in the presented experiment the gallium melting point is used, which is a defining fixed point of the International Temperature Scale of 1990 (ITS-90). Other points suitable for the SThM calibration are suggested, which makes the presented attempt the first step toward linking the quantitative SThM experiments with international temperature standards and therefore envisaging the traceability of nanoscale temperature measurements. (C) 2014 Elsevier B.V. All rights reserved.