DPL Based Electro-Thermal Modelling of Fin-FET Transistors

被引:0
作者
Raszkowski, T. [1 ]
Zubert, M. [1 ]
Zajac, P. [1 ]
Nowak, P. S. [1 ]
Janicki, M. [1 ]
Samson, A. [1 ]
Galicia, M. [1 ]
Napieralski, A. [1 ]
机构
[1] Lodz Univ Technol, Dept Microelect & Comp Sci, PL-90924 Lodz, Poland
来源
2016 15TH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM) | 2016年
关键词
electro-thermal coupling; Dual-Phase-Lag equation; Fourier-Kirchhoff equation; thermal analyses; nanoscale heat transfer; modern electronics; electric domain; thermal domain;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper the electro-thermal analyses related to the modelling of heat transfer in modern electronic structure, consisting of two nanosized transistors, are presented. The Dual-Phase-Lag model appropriate for such kind of structure instead of the classical Fourier-Kirchhoff model is used. Moreover, the thermal and electric domains coupling is described. Furthermore, the paper contains empirical information connected with implementation of algorithms using multiprocessor supercomputers built in the Intel Xeon CPU technology.
引用
收藏
页码:1093 / 1098
页数:6
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