Contextual Anomaly Detection in Solder Paste Inspection with Multi-Task Learning

被引:9
作者
Zheng, Zimu [1 ,2 ]
Pu, Jie [2 ]
Liu, Linghui [2 ]
Wang, Dan [1 ]
Mei, Xiangming [2 ]
Zhang, Sen [2 ]
Dai, Quanyu [1 ]
机构
[1] Hong Kong Polytech Univ, Dept Comp, Hung Hom, Yokchoi Rd 11, Hong Kong, Peoples R China
[2] Huawei Cloud, Edge Cloud Innovat Lab, Huawei Base E1, Shenzhen, Peoples R China
关键词
Contextual anomaly detection; multi-task learning; GENERAL COEFFICIENT; SIMILARITY;
D O I
10.1145/3383261
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In this article, we study solder paste inspection (SPI), an important stage that is used in the semiconductor manufacturing industry, where abnormal boards should be detected. A highly accurate SPI can substantially reduce human expert involvement, as well as reduce the waste in disposing of the boards in good condition. A key difference today is that because of increasing demand in board customization, the number of board types increases substantially and quantity of the boards produced in each type decreases. Thus, the previous approaches where a fine-tuned model is developed for each board type are no longer viable. Intrinsically, our problem is an anomaly detection problem. A major specialty in today's SPI is that the target tasks for prediction cannot be fully pre-determined due to context changes during the solder paste printing stage. Our experiences show that a conventional approach to first define a set of tasks and train these tasks offline will lead to low accuracy. Here, we propose a novel multi-task approach, where the performance of all target tasks is ensured simultaneously. We note that the SPI process is streamlined and automatic, allowing the SPI time for only a few seconds. We propose a fast clustering algorithm that reuses existing models to avoid retraining and fine tune in the inference phase. We evaluate our approach using 3-month data collected from production lines. We show that we can reduce 81.28% of false alarms. This can translate to annual savings of $11.3 million.
引用
收藏
页数:17
相关论文
共 60 条
[1]   Automatic detection of solder joint defects on integrated circuits [J].
Acciani, Giuseppe ;
Brunetti, Gioacchino ;
Fornarelli, Girolamo .
2007 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-11, 2007, :1021-1024
[2]  
Aggarwal CC, 2001, SIGMOD RECORD, V30, P37
[3]  
[Anonymous], 2011, P 17 ACM SIGKDD INT, DOI DOI 10.1145/2020408.2020549
[4]  
[Anonymous], 2012, NUMERICAL ECOLOGY
[5]  
[Anonymous], 2018, 11179 ISOIEC
[6]  
[Anonymous], 2008, AAAI
[7]  
Australian Institute of Health andWelfare, 2018, METEOR AUSTR NAT HLT
[8]   Brick: Towards a Unified Metadata Schema For Buildings [J].
Balaji, Bharathan ;
Bhattacharya, Arka ;
Fierro, Gabriel ;
Gao, Jingkun ;
Gluck, Joshua ;
Hong, Dezhi ;
Johansen, Aslak ;
Koh, Jason ;
Ploennigs, Joern ;
Agarwal, Yuvraj ;
Berges, Mario ;
Culler, David ;
Gupta, Rajesh ;
Kjaergaard, Mikkel Baun ;
Srivastava, Mani ;
Whitehouse, Kamin .
BUILDSYS'16: PROCEEDINGS OF THE 3RD ACM CONFERENCE ON SYSTEMS FOR ENERGY-EFFCIENT BUILT ENVIRONMENTS, 2016, :41-50
[9]  
BETS Research Group, 2017, UN MET SCHEM BUILD
[10]   LOF: Identifying density-based local outliers [J].
Breunig, MM ;
Kriegel, HP ;
Ng, RT ;
Sander, J .
SIGMOD RECORD, 2000, 29 (02) :93-104