MULTI-VIEW DEEP METRIC LEARNING FOR IMAGE CLASSIFICATION

被引:0
作者
Li, Dewei [1 ,2 ]
Tang, Jingjing [1 ,2 ]
Tian, Yingjie [2 ,3 ]
Ju, Xuchan [4 ,5 ]
机构
[1] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
[2] Chinese Acad Sci, Res Ctr Fictitious Econ & Data Sci, Beijing 100190, Peoples R China
[3] Chinese Acad Sci, Key Lab Big Data Min & Knowledge Management, Beijing 100190, Peoples R China
[4] Tsinghua Univ, Sch Econ & Management, Beijing 100083, Peoples R China
[5] Postdoctoral Programme Agr Bank China, Beijing 100005, Peoples R China
来源
2017 24TH IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP) | 2017年
基金
中国国家自然科学基金; 北京市自然科学基金;
关键词
Metric learning; Multi-view learning; Deep learning; Neural network;
D O I
暂无
中图分类号
TB8 [摄影技术];
学科分类号
0804 ;
摘要
In this paper, we propose a new deep metric learning approach, called MVDML, for multi-view image classification. Multi-view features can provide more information than single view, however, it is a challenge to exploit and fuse the complementary information from multiple views. Multiple deep neural networks are constructed, each corresponds to a view, to extract nonlinear information from images The nonlinear transformation is an improvement on linear transformation of metric learning. All the original images will be transformed into a lower-dimensional space. In each new space, the difference between intra-class distance and inter-class distance is maximized To extract information from different views as much as possible, the difference between different views of the same image is minimized The numerical experiments verify that our model can obtain competitive performance in image classification and runs faster than the baseline methods.
引用
收藏
页码:4142 / 4146
页数:5
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