Fabrication of amorphous silicon carbide films using VHF-PECVD for triple junction thin-film solar cell applications

被引:58
作者
Yunaz, Ihsanul Afdi [1 ]
Hashizume, Kenji [2 ]
Miyajima, Shinsuke [1 ]
Yamada, Akira [3 ]
Konagai, Makoto [1 ]
机构
[1] Tokyo Inst Technol, Dept Phys Elect, Meguro Ku, Tokyo 1528552, Japan
[2] Tokyo Inst Technol, Dept Elect & Elect Engn, Meguro Ku, Tokyo 1528552, Japan
[3] Tokyo Inst Technol, Quantum Nanoelect Res Ctr, Meguro Ku, Tokyo 1528552, Japan
关键词
Amorphous silicon carbide; VHF-PECVD; Monomethyl silane; Solar cell; Light stability; MICROCRYSTALLINE SILICON; SIC-H; DILUTION; ALLOYS;
D O I
10.1016/j.solmat.2008.11.048
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Preparation of intrinsic hydrogenated amorphous silicon carbide (i-a-SiC:H) thin films for use as a top cell of triple junction solar cells is presented. These films were deposited using very-high-frequency plasma-enhanced chemical vapor deposition (VHF-PECVD) technique with monomethyl silane (MMS) gas as the carbon source. Deposition conditions were explored to obtain films with a wide gap and low defect density. It was confirmed that the hydrogen dilution ratio plays an important role in enhancing the film properties. Employing a-SiC:H film as an intrinsic layer of single junction cell, open-circuit voltage as high as 0.99V has been achieved. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:1056 / 1061
页数:6
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