Transient analysis of bang-bang phase locked loops

被引：6

作者：

Chan, M. ^{[1
]}

Postula, A. ^{[1
]}

机构：

[1] Univ Queensland, Sch Informat Technol & Elect Engn, Brisbane, Qld, Australia

来源：

IET CIRCUITS DEVICES & SYSTEMS | 2009年 / 3卷 / 02期

关键词：

DATA RECOVERY CIRCUITS; DESIGN; CLOCK;

D O I：

10.1049/iet-cds.2008.0119

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This work gives insight into the behaviour of second-order bang-bang phase locked loops in the far from lock region. This region, while largely unexplored, is of particular interest as PLL behaviour in this region determines locking time and capture range. By analysing PLL cycle slipping behaviour in this region, the transient response for the system is derived. Expressions for first-order system stability and locking time are also presented.

引用

页码：76 / 82

页数：7

共 9 条

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