Aging of copper-nickel-cobalt manganite NTC thermistors

被引：0

作者：

Mrooz, O ^{[1
]}

Hadzaman, I ^{[1
]}

Vakiv, M ^{[1
]}

Shpotyuk, O ^{[1
]}

Plewa, J ^{[1
]}

Altenburg, H ^{[1
]}

Uphoff, H ^{[1
]}

机构：

[1] Sci Res Co Carat, UA-79031 Lvov, Ukraine

来源：

2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS | 2002年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Aging phenomenon in copper-nickel-cobalt manganite NTC thermistors under thermal stresses at 125 and 170 C during 1000 h was studied. The relative resistance drift observed in NTC thermistors is correlated with the results of ceramics microstructures characterization (obtained by optical microscopy, SEM, electron probe and EDX microanalyses) and thermogravimetric analysis.

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页码：375 / 378

页数：4

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