Electronic structure of In2O3 from resonant x-ray emission spectroscopy

被引:42
作者
Piper, L. F. J. [1 ]
DeMasi, A. [1 ]
Cho, S. W. [1 ]
Smith, K. E. [1 ]
Fuchs, F. [2 ,3 ]
Bechstedt, F. [2 ,3 ]
Koerber, C. [4 ]
Klein, A. [4 ]
Payne, D. J. [5 ]
Egdell, R. G. [5 ]
机构
[1] Boston Univ, Dept Phys, Boston, MA 02215 USA
[2] Univ Jena, Inst Festkorpertheorie & Opt, D-07743 Jena, Germany
[3] Univ Jena, ETSF, D-07743 Jena, Germany
[4] Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany
[5] Univ Oxford, Chem Res Lab, Oxford OX1 3TA, England
基金
英国工程与自然科学研究理事会;
关键词
conduction bands; density functional theory; electronic density of states; indium compounds; semiconductor materials; valence bands; X-ray absorption spectra; X-ray emission spectra; X-ray photoelectron spectra; SCATTERING;
D O I
10.1063/1.3070524
中图分类号
O59 [应用物理学];
学科分类号
摘要
The valence and conduction band structures of In2O3 have been measured using a combination of valence band x-ray photoemission spectroscopy, O K-edge resonant x-ray emission spectroscopy, and O K-edge x-ray absorption spectroscopy. Excellent agreement is noted between the experimental spectra and O 2p partial density of states calculated within hybrid density functional theory. Our data are consistent with a direct band gap for In2O3.
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页数:3
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