Photodetection Properties of ZnO/Si Heterojunction Diode: A Simulation Study

被引:18
|
作者
Sharma, Shashikant [1 ]
Sumathi, A. [2 ]
Periasamy, C. [1 ,3 ]
机构
[1] Malaviya Natl Inst Technol, Dept Elect & Commun Engn, Jaipur, Rajasthan, India
[2] Adhiyamaan Coll Engn, Dept Elect & Commun Engn, Hosur, India
[3] Malaviya Natl Inst Technol, Mat Res Ctr, Jaipur, Rajasthan, India
关键词
Detectivity; Noise equivalent power; Photodetector; Quantum efficiency; Responsivity; ZnO/Si heterojunction; RF-SPUTTERING TECHNIQUE; THIN-FILMS; ULTRAVIOLET PHOTODETECTORS; ANALYTICAL-MODEL; SI; PHOTODIODE; PERFORMANCE; ATLAS;
D O I
10.1080/02564602.2016.1145558
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article reports simulation study and performance analysis of ZnO/Si heterojunction-based UV-visible photodetector. Different electrical and optical parameters such as energy band diagram, electric field profile, dark current, quantum efficiency, responsivity, detectivity, and noise equivalent power of ZnO/Si heterojunction-based photodetector have been simulated as a function of device thickness, operating wavelength, and applied reverse bias voltage. The simulation software ATLAS (TM) in SILVACO package is used to describe the effect of ZnO/Si interface properties on its photodetection. The value obtained for external quantum efficiency, responsivity, and specific detectivity for ZnO/Si heterojunction-based photodetector were similar to 93%, 0.36 A/W, and 7.2 x 10(10) cm Hz(1/2) W-1, respectively. The estimated values for dark current and noise equivalent power were of the order of 10(-14) A and 10(-11) W, respectively.
引用
收藏
页码:83 / 90
页数:8
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