Energy-filtered reflection high-energy electron diffraction apparatus combined with energy-loss measurement system

被引：7

作者：

Horio, Y ^{[1
]}

Hara, T ^{[1
]}

机构：

[1] Daido Inst Technol, Dept Elect Engn & Elect, Minami Ku, Nagoya, Aichi 4578530, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2002年 / 41卷 / 6B期

关键词：

RHEED; energy filter; inelastic scattering; energy loss; surface plasmon; Si(111)7x7;

D O I：

10.1143/JJAP.41.L736

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A newly improved energy-filtered reflection high-energy electron diffraction apparatus equipped with three grids has been constructed, which is combined with an energy-loss measurement system using a channeltron detector, high frequency modulation of retarding voltage and a lock-in amplifier. The apparatus enables measurement of energy-loss spectra of reflection high-energy electron diffraction (RHEED) beams directly with an energy resolution of 6 eV. Efficiency of the apparatus has been demonstrated by energy-loss spectra measured from a Si(111)7 x 7 surface as an example.

引用

页码：L736 / L737

页数：2

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