Atomic force microscopy analysis of different surface treatments of Ti dental implant surfaces

被引:43
作者
Bathomarco, RV
Solorzano, G
Elias, CN
Prioli, R
机构
[1] Pontificia Univ Catolica Rio de Janeiro, Dept Fis, BR-22452970 Rio De Janeiro, Brazil
[2] Pontificia Univ Catolica Rio de Janeiro, Dept Ciencia Mat & Met, BR-22452970 Rio De Janeiro, Brazil
[3] Univ Fed Fluminense, Dept Met, Rio De Janeiro, Brazil
关键词
dental implants; titanium; surface modification; atomic force microscopy;
D O I
10.1016/j.apsusc.2004.04.007
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The surface of commercial unalloyed titanium, used in dental implants, was analyzed by atomic force microscopy. The morphology, roughness, and surface area of the samples, submitted to mechanically-induced erosion, chemical etching and a combination of both, were compared. The results show that surface treatments strongly influence the dental implant physical and chemical properties. An analysis of the length dependence of the implant surface roughness shows that, for scan sizes larger than 50 mum, the average surface roughness is independent of the scanning length and that the surface treatments lead to average surface roughness in the range of 0.37 up to 0.48 mum. It is shown that the implant surface energy is sensitive to the titanium surface area. As the area increases there is a decrease in the surface contact angle. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:29 / 34
页数:6
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