Realization of high energy density in an ultra-wide temperature range through engineering of ferroelectric sandwich structures

被引:57
作者
Fan, Qiaolan [1 ,2 ,3 ]
Ma, Chunrui [2 ,3 ]
Li, Yi [1 ,2 ,3 ]
Liang, Zhongshuai [1 ,2 ,3 ]
Cheng, Sheng [1 ,2 ,3 ]
Guo, Mengyao [4 ]
Dai, Yanzhu [1 ,2 ,3 ]
Ma, Chuansheng [1 ,2 ,3 ]
Lu, Lu [1 ,2 ,3 ]
Wang, Wei [5 ]
Wang, Linghang [6 ]
Lou, Xiaojie [4 ]
Liu, Ming [1 ,2 ,3 ]
Wang, Hong [1 ,2 ,3 ,7 ,8 ]
Jia, Chun-Lin [1 ,2 ,3 ,9 ]
机构
[1] Xi An Jiao Tong Univ, Sch Microelect, Xian 710049, Shaanxi, Peoples R China
[2] Xi An Jiao Tong Univ, State Key Lab Mech Behav Mat, Xian 710049, Shaanxi, Peoples R China
[3] Xi An Jiao Tong Univ, Sch Mat Sci & Engn, Xian 710049, Shaanxi, Peoples R China
[4] Xi An Jiao Tong Univ, Frontier Inst Sci & Technol, Xian 710049, Shaanxi, Peoples R China
[5] Northwest Inst Nucl Technol, Xian 710049, Shaanxi, Peoples R China
[6] Xi An Jiao Tong Univ, Sch Elect Sci & Engn, Xian 710049, Shaanxi, Peoples R China
[7] Southern Univ Sci & Technol, Dept Mat Sci & Engn, Shenzhen 518055, Peoples R China
[8] Southern Univ Sci & Technol, Shenzhen Engn Res Ctr Novel Elect Informat Mat &, Shenzhen 518055, Peoples R China
[9] Forschungszentrum Julich, Ernst Ruska Ctr Microscopy & Spect Electrons, D-52425 Julich, Germany
关键词
Thin film dielectrics; Sandwich-structure; Energy storage density; Thermal stability; High temperature; STORAGE DENSITY; DIELECTRIC MATERIALS; BREAKDOWN STRENGTH; THERMAL-STABILITY; THIN-FILMS; CAPACITORS; POLYMER;
D O I
10.1016/j.nanoen.2019.05.076
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Thin film dielectrics are the most selected materials for many power electronics owing to their inherent advantages, such as high power density, fast charging-discharging, and long lifetime. Nowadays, additional demands for the film dielectrics are the high performances under harsh operating conditions, e.g. at high temperatures, which is highly favourable to significantly reduce the size and cost of energy devices. Here, we demonstrated that through design and optimization of the film systems with 1 mol% SiO2-doped BaZr0.35Ti0.65O3 layer sandwiched between two undoped BaZr0.35Ti0.65O3 layers, it is capable to concomitantly enhance breakdown strength and electrical polarization of the systems. The optimized sandwich-structure films yield a greatly improved discharged energy densities of similar to 130.1 J/cm(3) with a high charge-discharge efficiency of similar to 73.8% at room temperature, as well as retain an ultrahigh discharged energy densities of similar to 77.8 J/cm(3) in the ultra-wide temperature range from -100 to 200 degrees C. The presented combination of property modulation with structure engineering paves an effective way to meet the increasingly technological challenges and the requirements of modern electrical energy storage applications.
引用
收藏
页码:725 / 733
页数:9
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