Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation

被引：23

作者：

Majos, S. Sanchez ^{[1
]}

Achenbach, P. ^{[1
]}

Gayoso, C. Ayerbe ^{[1
]}

Bernauer, J. C. ^{[1
]}

Boehm, R. ^{[1
]}

Distler, M. O. ^{[1
]}

de la Paz, M. Gomez Rodriguez ^{[1
]}

Merkel, H. ^{[1
]}

Mueller, U. ^{[1
]}

Nungesser, L. ^{[1
]}

Pochodzalla, J. ^{[1
]}

Schlimme, B. S. ^{[1
]}

Walcher, Th. ^{[1
]}

Weinriefer, M. ^{[1
]}

Yoon, C. J. ^{[1
]}

机构：

[1] Johannes Gutenberg Univ Mainz, Inst Kernphys, D-6500 Mainz, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2009年 / 602卷 / 02期

关键词：

Silicon photomultiplier; Tracking and position-sensitive detectors; Particle detector design; Radiation damage;

D O I：

10.1016/j.nima.2009.01.176

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

For the electron arm tracking system in the KAOS spectrometer at the Mainz Microtron MAMI a detector based on 2 m long scintillating fibres read out by silicon photomultipliers (SiPM) is planned. Because of the detector's close proximity to the intense electron beam a study of noise and radiation damage in SiPM has been performed. A sample of devices was exposed directly to a 14 MeV electron beam and to a mixed radiation field in the experimental area. First noticeable effects are a large increase in the dark count rate and a severe loss of the gain uniformity. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：506 / 510

页数：5

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