Detection of graphene domains and defects using liquid crystals

被引:61
作者
Son, Jong-Ho [1 ]
Baeck, Seung-Jae [2 ]
Park, Min-Ho [3 ]
Lee, Jae-Bok [2 ]
Yang, Cheol-Woong [3 ]
Song, Jang-Kun [4 ]
Zin, Wang-Cheol [1 ]
Ahn, Jong-Hyun [2 ]
机构
[1] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea
[2] Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South Korea
[3] Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
[4] Sungkyunkwan Univ, Sch Elect & Elect Engn, Suwon 440746, South Korea
来源
NATURE COMMUNICATIONS | 2014年 / 5卷
基金
新加坡国家研究基金会;
关键词
CHEMICAL-VAPOR-DEPOSITION; TILT GRAIN-BOUNDARIES; GROWTH; TRANSPORT; STRENGTH;
D O I
10.1038/ncomms4484
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The direct observation of the domain size and defect distribution in a graphene film is important for the development of electronic applications involving graphene. Here we report a promising method for observing graphene domains grown by chemical vapour deposition. The unavoidable development of crack or pinhole defects during the growth and transfer processes is visualized using a liquid crystal layer. Liquid crystal molecules align anisotropically with respect to the graphene domains and exhibit distinct birefringence properties that can be used to image the graphene domains. This approach is useful for visualizing the crack distributions and their generation process in graphene films under external strain. This type of simple observation method provides an effective route to evaluating the quality and reliability of graphene sheets for use in various electronic devices.
引用
收藏
页数:7
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