Sputtered Ni-Mn-Ga thin films

被引：1
|
作者：
Dubowik, J.
Kudryavtsev, Y. V.
Goscianska, I.
机构：
[1] Polish Acad Sci, Inst Mol Phys, PL-60179 Poznan, Poland
[2] Natl Acad Sci Ukraine, Inst Met Phys, UA-03142 Kiev, Ukraine
[3] Adam Mickiewicz Univ Poznan, Dept Phys, PL-61614 Poznan, Poland
来源：
INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS | 2006年 / 23卷 / 1-2期
关键词：
magnetic shape memory alloys; thin films; ferromagnetic resonance;
D O I：
10.3233/JAE-2006-729
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report results of ferromagnetic resonance measurements on sputtered NixMnyGaz films of various compositions annealed from 620-973 K. Anomalous magnetic behavior of the Ni-Mn-Ga films annealed at T < 800 K results from their columnar microstructure and changes in the magnetic anisotropy due to the martensitic transformation. The films annealed at the highest temperatures have the magnetic behavior typical of normal ferromagnetic films, in which the effect of the martensitic transformation is strongly reduced due to constraint of a substrate.
引用
收藏
页码：89 / 92
页数：4
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