Edge-modulated perpendicular magnetic anisotropy in [Co/Pd]n and L10-FePt thin film wires

被引：2

作者：

Zhang, Jinshuo ^{[1
]}

Ho, Pin ^{[1
]}

Currivan-Incorvia, Jean Anne ^{[2
,3
]}

Siddiqui, Saima A. ^{[3
]}

Baldo, Marc A. ^{[3
]}

Ross, Caroline A. ^{[1
]}

机构：

[1] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA

[2] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA

[3] MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA

来源：

APPLIED PHYSICS LETTERS | 2015年 / 107卷 / 18期

关键词：

CRYSTALLOGRAPHIC ORIENTATION; FEPT; REVERSAL; PD/CO; AXIS;

D O I：

10.1063/1.4935104

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Thickness modulation at the edges of nanostructured magnetic thin films is shown to have important effects on their perpendicular magnetic anisotropy. Thin film wires with tapered edges were made from [Co/Pd](20) multilayers or L1(0)-FePt films using liftoff with a double-layer resist. The effect of edge taper on the reversal process was studied using magnetic force microscopy and micromagnetic modeling. In [Co/Pd](20), the anisotropy was lower in the tapered edge regions which switched at a lower reverse field compared to the center of the wire. The L1(0)-FePt wires showed opposite behavior with the tapered regions exhibiting higher anisotropy. (C) 2015 AIP Publishing LLC.

引用

页数：5

共 24 条

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