Performance and Modeling of the MWIR HgCdTe Electron Avalanche Photodiode

被引:20
作者
Beck, Jeffrey [1 ]
Scritchfield, Richard [1 ]
Sullivan, Billy [1 ]
Teherani, Jamie [1 ]
Wan, Chang-Feng [1 ]
Kinch, Mike [1 ]
Ohlson, Martha [1 ]
Skokan, Mark [1 ]
Wood, Lewis [1 ]
Mitra, Pradip [1 ]
Goodwin, Mike [1 ]
Robinson, Jim [1 ]
机构
[1] DRS Technol Infrared Technol Div, Dallas, TX 75374 USA
关键词
HgCdTe; avalanche photodiode; gain; excess noise; cylindrical; spot scan; diffusion length; point spread function; bandwidth; fill factor; collection efficiency; dark current; capacitance; spectral; FPA;
D O I
10.1007/s11664-009-0684-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The operation of the mid-wave infrared (MWIR) HgCdTe cylindrical electron injection avalanche photodiode (e-APD) is described. The measured gain and excess noise factor are related to the collection region fill factor. A two-dimensional diffusion model calculates the time-dependent response and steady-state pixel point spread function for cylindrical diodes, and predicts bandwidths near 1 GHz for small geometries. A 2 mu m diameter spot scan system was developed for point spread function and crosstalk measurements at 80 K. An electron diffusion length of 13.4 mu m was extracted from spot scan data. Bandwidth data are shown that indicate bandwidths in excess of 300 MHz for small unit cells geometries. Dark current data, at high gain levels, indicate an effective gain normalized dark density count as low as 1000 counts/mu s/cm(2) at an APD gain of 444. A junction doping profile was determined from capacitance-voltage data. Spectral response data shows a gain-independent characteristic.
引用
收藏
页码:1579 / 1592
页数:14
相关论文
共 11 条
[1]   The HgCdTe electron avalanche photodiode [J].
Beck, J. ;
Wan, C. ;
Kinch, M. ;
Robinson, J. ;
Mitra, P. ;
Scritchfield, R. ;
Ma, F. ;
Campbell, J. .
JOURNAL OF ELECTRONIC MATERIALS, 2006, 35 (06) :1166-1173
[2]   Gated IR imaging with 128 x 128 HgCdTe electron avalanche photodiode FPA [J].
Beck, Jeff ;
Woodall, Milton ;
Scritchfield, Richard ;
Ohlson, Martha ;
Wood, Lewis ;
Mitra, Pradip ;
Robinson, Jim .
JOURNAL OF ELECTRONIC MATERIALS, 2008, 37 (09) :1334-1343
[3]  
GOODWIN M, 2008, MSS SPEC GROUP M DET
[4]   HDVIP™ FPA technology at DRS [J].
Kinch, MA .
INFRARED TECHNOLOGY AND APPLICATIONS XXVII, 2001, 4369 :566-578
[5]   Study of diffusion length in two-dimensional HgCdTe avalanche photodiodes by optical beam induced current [J].
Liu, MG ;
Wang, SL ;
Campbell, JC ;
Beck, JD ;
Wan, CF ;
Kinch, MA .
JOURNAL OF APPLIED PHYSICS, 2005, 98 (07)
[6]  
PERRAIS G, 2009, J ELECT MAT IN PRESS
[7]   Impulse response time measurements in Hg0.7Cd0.3Te MWIR avalanche photodiodes [J].
Perrais, Gwladys ;
Rothman, Johan ;
Destefanis, Gerard ;
Chamonal, Jean-Paul .
JOURNAL OF ELECTRONIC MATERIALS, 2008, 37 (09) :1261-1273
[8]   Gain and dark current characteristics of planar HgCdTe avalanche photo diodes [J].
Perrais, Gwladys ;
Gravrand, Olivier ;
Baylet, Jacques ;
Destefanis, Gerard ;
Rothman, Johan .
JOURNAL OF ELECTRONIC MATERIALS, 2007, 36 (08) :963-970
[9]   Characterization of HgCdTe MWIR back-illuminated electron-initiated avalanche photodiodes [J].
Reine, M. B. ;
Marciniec, J. W. ;
Wong, K. K. ;
Parodos, T. ;
Mullarkey, J. D. ;
Lamarre, P. A. ;
Tobin, S. P. ;
Minich, R. W. ;
Gustavsen, K. A. ;
Compton, M. ;
Williams, G. M. .
JOURNAL OF ELECTRONIC MATERIALS, 2008, 37 (09) :1376-1386
[10]   HgCdTe MWIR back-illuminated electron-initiated avalanche photodiode arrays [J].
Reine, M. B. ;
Marciniec, J. W. ;
Wong, K. K. ;
Parodos, T. ;
Mullarkey, J. D. ;
Lamarre, P. A. ;
Tobin, S. P. ;
Gustavsen, K. A. ;
Williams, G. M. .
JOURNAL OF ELECTRONIC MATERIALS, 2007, 36 (08) :1059-1067