TEXTURE AND MICROSTUCTURE STUDIES ON FILMS OF Ni-Mn-Ga PRODUCED BY R. F. SPUTTERING AND PULSED LASER DEPOSITION

被引：0

作者：

Zhang, Y. P. ^{[1
]}

Hughes, R. A. ^{[2
]}

Preston, J. S. ^{[3
]}

Botton, G. A. ^{[1
]}

Niewczas, M. ^{[1
]}

机构：

[1] McMaster Univ, Dept Mat Sci & Engn, 1280 Main St W, Hamilton, ON L8S 4L7, Canada

[2] McMaster Univ, Brokhouse Inst Mat Res, Hamilton, ON L8S 4M1, Canada

[3] McMaster Univ, Dept Engn Phys, Hamilton, ON L8S 4L7, Canada

来源：

STATE-OF-THE-ART RESEARCH AND APPLICATION OF SMAS TECHNOLOGIES | 2009年 / 59卷

基金：

加拿大自然科学与工程研究理事会;

关键词：

Ni-Mn-Ga; magnetic shape memory alloys; thin film; pulsed laser deposition; r; f; sputtering; texture; morphology; THIN-FILMS;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Introduction Ni-Mn-Ga films were grown on (110) MgO substrates by r.f. sputtering and pulsed laser deposition techniques. Texture analyses, in combination with electron microscopy measurements, reveal that the films from the two deposition techniques both have a cubic L2(1) structure, but differ in terms of their texture and grain morphology. The sputtered films grow along the < 110 > direction with completely random in-plane orientation. The PLD films, on the other hand, grow in the < 422 > direction such that there exists two distinct grain-types, where both types share an epitaxial relationship with the substrate. In general, the overall quality of the PLD films is better than the sputtered films. The growth conditions that influence film morphology and texture are discussed.

引用

页码：11 / +

页数：2

共 3 条

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