Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface

被引：46

作者：

Collins, Liam ^{[1
,2
]}

Kilpatrick, Jason I. ^{[2
]}

Vlassiouk, Ivan V. ^{[3
]}

Tselev, Alexander ^{[4
]}

Weber, Stefan A. L. ^{[2
]}

Jesse, Stephen ^{[4
]}

Kalinin, Sergei V. ^{[4
]}

Rodriguez, Brian J. ^{[1
,2
]}

机构：

[1] Univ Coll Dublin, Sch Phys, Dublin 4, Ireland

[2] Univ Coll Dublin, Conway Inst Biomol & Biomed Res, Dublin 4, Ireland

[3] Oak Ridge Natl Lab, Energy & Transportat Sci Div, Oak Ridge, TN 37831 USA

[4] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA

来源：

APPLIED PHYSICS LETTERS | 2014年 / 104卷 / 13期

基金：

爱尔兰科学基金会;

关键词：

CHEMICAL-VAPOR-DEPOSITION; LABEL-FREE; LAYER; ELECTROCHEMISTRY; PROTECTION; COATINGS; WATER;

D O I：

10.1063/1.4870074

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions. However, for many energy storage and conversion systems, including graphene-based electrochemical capacitors, understanding electrochemical phenomena at the solid-liquid interface is paramount. Despite the vast potential to provide fundamental insight for energy storage materials at the nanoscale, KPFM has found limited applicability in liquid environments to date. Here, using dual harmonic (DH)-KPFM, we demonstrate CPD imaging of graphene in liquid. We find good agreement with measurements performed in air, highlighting the potential of DH-KPFM to probe electrochemistry at the graphene-liquid interface. (C) 2014 AIP Publishing LLC.

引用

页数：5

共 45 条

[1] High-Frequency Electromechanical Imaging of Ferroelectrics in a Liquid Environment [J].

Balke, Nina ;

Jesse, Stephen ;

Chu, Ying-Hao ;

Kalinin, Sergei V. .

ACS NANO, 2012, 6 (06) :5559-5565

[2] Electrochemistry at the Edge of a Single Graphene Layer in a Nanopore [J].

Banerjee, Shouvik ;

Shim, Jiwook ;

Rivera, Jose ;

Jin, Xiaozhong ;

Estrada, David ;

Solovyeva, Vita ;

You, Xueqiu ;

Pak, James ;

Pop, Eric ;

Aluru, Narayana ;

Bashir, Rashid .

ACS NANO, 2013, 7 (01) :834-843

[3]

Banhart F, 2011, ACS NANO, V5, P26, DOI [10.1021/nn102598m, 10.1016/B978-0-08-102053-1.00005-3]

[4] Towards an understanding of induced-charge electrokinetics at large applied voltages in concentrated solutions [J].

Bazant, Martin Z. ;

Kilic, Mustafa Sabri ;

Storey, Brian D. ;

Ajdari, Armand .

ADVANCES IN COLLOID AND INTERFACE SCIENCE, 2009, 152 (1-2) :48-88

[5] Diffuse-charge dynamics in electrochemical systems [J].

Bazant, Martin Z. ;

Thornton, Katsuyo ;

Ajdari, Armand .

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, 2004, 70 (2 1) :021506-1

[6] Oxidation Resistance of Graphene-Coated Cu and Cu/Ni Alloy [J].

Chen, Shanshan ;

Brown, Lola ;

Levendorf, Mark ;

Cai, Weiwei ;

Ju, Sang-Yong ;

Edgeworth, Jonathan ;

Li, Xuesong ;

Magnuson, Carl W. ;

Velamakanni, Aruna ;

Piner, Richard D. ;

Kang, Junyong ;

Park, Jiwoong ;

Ruoff, Rodney S. .

ACS NANO, 2011, 5 (02) :1321-1327

[7] Quantitative noncontact electrostatic force Imaging of nanocrystal polarizability [J].

Cherniavskaya, O ;

Chen, LW ;

Weng, V ;

Yuditsky, L ;

Brus, LE .

JOURNAL OF PHYSICAL CHEMISTRY B, 2003, 107 (07) :1525-1531

[8] Synthesis of Graphene and Its Applications: A Review [J].

Choi, Wonbong ;

Lahiri, Indranil ;

Seelaboyina, Raghunandan ;

Kang, Yong Soo .

CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 2010, 35 (01) :52-71

[9] Open loop Kelvin probe force microscopy with single and multi-frequency excitation [J].

Collins, L. ;

Kilpatrick, J. I. ;

Weber, S. A. L. ;

Tselev, A. ;

Vlassiouk, I. V. ;

Ivanov, I. N. ;

Jesse, S. ;

Kalinin, S. V. ;

Rodriguez, B. J. .

NANOTECHNOLOGY, 2013, 24 (47)

[10]

Collins L., 2012, 2012 EUR C APPL POL, P1

← 1 2 3 4 5 →