Probability of defect detection in pulse compression favourable frequency modulated thermal wave imaging

被引:10
作者
Kher, V. [1 ]
Mulaveesala, R. [1 ]
机构
[1] Indian Inst Technol Ropar, Dept Elect Engn, InfraRed Imaging Lab IRIL, Rupnagar 140001, PB, India
关键词
THERMOGRAPHY; RELIABILITY;
D O I
10.1049/el.2019.0895
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Infrared thermography plays a vital role in the thermal non-destructive testing and evaluation (TNDT) due to its merits such as whole-field, remote and quantitative defect detection capabilities. Among the various TNDT methods, recently proposed, pulse compression favourable thermal wave imaging gained its importance due to its merits in terms of defect detection sensitivity and resolution. This Letter attempts to compare different post-processing schemes to compare their sub-surface defect detection capabilities for a glass fibre reinforced polymer test sample. Results obtained clearly show defect detection probability of the matched filter-based post-processing approaches are far superior to that of the conventional frequency domain phase approach.
引用
收藏
页码:789 / +
页数:3
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