Precise lattice location of substitutional and interstitial Mg in AlN

被引:10
作者
Amorim, L. M. [1 ]
Wahl, U. [2 ]
Pereira, L. M. C. [1 ]
Decoster, S. [1 ]
Silva, D. J. [2 ,3 ,4 ]
da Silva, M. R. [5 ]
Gottberg, A. [6 ]
Correia, J. G. [2 ]
Temst, K. [1 ]
Vantomme, A. [1 ]
机构
[1] Katholieke Univ Leuven, Inst Kern Stralingsfys, B-3001 Louvain, Belgium
[2] Univ Lisbon, Inst Super Tecn, Ctr Ciencias & Tecnol Nucl, P-2686953 Sacavem, Portugal
[3] Univ Porto, IFIMUP, P-4169007 Oporto, Portugal
[4] Univ Porto, IN Inst Nanosci & Nanotechnol, P-4169007 Oporto, Portugal
[5] Univ Lisbon, Ctr Fis Nucl, P-1649003 Libsoa, Portugal
[6] CERN, ISOLDE, CH-1211 Geneva 23, Switzerland
关键词
EMISSION; GAN;
D O I
10.1063/1.4858389
中图分类号
O59 [应用物理学];
学科分类号
摘要
The lattice site location of radioactive Mg-27 implanted in AlN was determined by means of emission channeling. The majority of the Mg-27 was found to substitute for Al, yet significant fractions (up to 33%) were also identified close to the octahedral interstitial site. The activation energy for interstitial Mg diffusion is estimated to be between 1.1 eV and 1.7 eV. Substitutional Mg is shown to occupy ideal Al sites within a 0.1 angstrom experimental uncertainty. We discuss the absence of significant displacements from ideal Al sites, in the context of the current debate, on Mg doped nitride semiconductors. (C) 2013 AIP Publishing LLC.
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页数:5
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共 34 条
[1]   Magnetic resonance and the structure of magnesium acceptors in gallium nitride [J].
Davies, J. J. .
PHYSICAL REVIEW B, 2013, 87 (23)
[2]   Theoretical evidence for the semi-insulating character of AlN [J].
Fara, A ;
Bernardini, F ;
Fiorentini, V .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (03) :2001-2003
[3]   X-RAY-DIFFRACTION DETERMINATION OF VALENCE-ELECTRON DENSITY IN ALUMINUM NITRIDE [J].
GABE, E ;
LEPAGE, Y ;
MAIR, SL .
PHYSICAL REVIEW B, 1981, 24 (10) :5634-5641
[4]   EMISSION CHANNELING AND BLOCKING [J].
HOFSASS, H ;
LINDNER, G .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1991, 201 (03) :121-183
[5]   Ultraviolet light-emitting diodes based on group three nitrides [J].
Khan, Asif ;
Balakrishnan, Krishnan ;
Katona, Tom .
NATURE PHOTONICS, 2008, 2 (02) :77-84
[6]   On-line yields obtained with the ISOLDE RILIS [J].
Köster, U ;
Fedoseyev, VN ;
Andreyev, AN ;
Bergmann, UC ;
Catherall, R ;
Cederkäll, J ;
Dietrich, M ;
De Witte, H ;
Fedorov, DV ;
Fraile, L ;
Franchoo, S ;
Fynbo, H ;
Georg, U ;
Giles, T ;
Gorska, M ;
Hannawald, M ;
Huyse, M ;
Joinet, A ;
Jonsson, OC ;
Kratz, KL ;
Kruglov, K ;
Lau, C ;
Lettry, J ;
Mishin, VI ;
Oinonen, M ;
Partes, K ;
Peräjärvi, K ;
Pfeiffer, B ;
Ravn, HL ;
Seliverstov, MD ;
Thirolf, P ;
Van de Vel, K ;
Van Duppen, P ;
Van Roosbroeck, J ;
Weissman, L .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 204 :347-352
[7]   Dual nature of acceptors in GaN and ZnO: The curious case of the shallow MgGa deep state [J].
Lany, Stephan ;
Zunger, Alex .
APPLIED PHYSICS LETTERS, 2010, 96 (14)
[8]   Band structure and fundamental optical transitions in wurtzite AlN [J].
Li, J ;
Nam, KB ;
Nakarmi, ML ;
Lin, JY ;
Jiang, HX ;
Carrier, P ;
Wei, SH .
APPLIED PHYSICS LETTERS, 2003, 83 (25) :5163-5165
[9]   Shallow versus Deep Nature of Mg Acceptors in Nitride Semiconductors [J].
Lyons, John L. ;
Janotti, Anderson ;
Van de Walle, Chris G. .
PHYSICAL REVIEW LETTERS, 2012, 108 (15)
[10]   Acceptor binding energies in GaN and AlN [J].
Mireles, F ;
Ulloa, SE .
PHYSICAL REVIEW B, 1998, 58 (07) :3879-3887