Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area

被引：22

作者：

Chen, Shuming ^{[1
]}

Du, Yankang ^{[1
]}

Liu, Biwei ^{[1
]}

Qin, Junrui ^{[2
]}

机构：

[1] Natl Univ Def Technol, Sci & Technol Parallel & Distributed Proc Lab, Changsha 410073, Hunan, Peoples R China

[2] Chinese Elect Equipment Syst Engn Corp, Beijing 100141, Peoples R China

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2014年 / 61卷 / 01期

基金：

中国国家自然科学基金;

关键词：

Effective sensitive area; pulse width; SET; soft error vulnerabilities;

D O I：

10.1109/TNS.2014.2298889

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Concepts of effective sensitive area and effective SET pulse width are proposed to model the actual sensitive area. Simulation results present that the soft error vulnerabilities got by using the effective sensitive area can be almost an order larger than the ones got by using the normal approach when the ion LET is 30 MeV.cm(2)/mg. And heavy-ion experiments are conducted to demonstrate the simulation results.

引用

页码：646 / 653

页数：8

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