Crack patterns in thin films

被引：310
作者：
Xia, ZC
Hutchinson, JW
机构：
[1] Harvard Univ, Div Engn & Appl Sci, Cambridge, MA 02138 USA
[2] Ford Res Lab, Mfg Syst Dept, Dearborn, MI 48121 USA
来源：
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS | 2000年 / 48卷 / 6-7期
基金：
美国国家科学基金会;
关键词：
crack propagation; thin films; integral equations;
D O I：
10.1016/S0022-5096(99)00081-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A two-dimensional model of a film bonded to an elastic substrate is proposed for simulating crack propagation paths in thin elastic films. Specific examples are presented for films subject to equi-biaxial residual tensile stress. Single and multiple crack geometries are considered with a view to elucidating some of the crack patterns which are observed to develop. Tendencies for propagating cracks to remain straight or curve are explored as a consequence of crack interaction. The existence of spiral paths is demonstrated. (C) 2000 Elsevier Science Ltd. All rights reserved.
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页码：1107 / 1131
页数：25
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