Modified electronic speckle pattern interferometer with reduced number of elements for vibration analysis

被引:15
作者
Olszak, A
Patorski, K
机构
[1] Warsaw University of Technology, Inst. Micromechanics and Photonics, Optical Engineering Group, 02-525 Warsaw
关键词
ESPI; vibration measurement; laser diode wavelength modulation;
D O I
10.1016/S0030-4018(97)00049-7
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An improved electronic speckle pattern interferometry (ESPI) system for vibration analysis by the time-average method is presented. The optical path length imbalance introduced in the interferometer allows us to implement a new phase shift heterodyning technique for vibration analysis by wavelength modulation of the light source. All the functions required for obtaining good visibility time average vibration fringes are implemented using laser diode modulation only. No additional phase modulator is required, the number of elements is reduced resulting in a greater flexibility of measurement procedures, equipment simplification and cost reduction are obtained, Illustrative results of studies of vibration objects are given.
引用
收藏
页码:265 / 269
页数:5
相关论文
共 14 条
[1]   HETERODYNING OF FIBER OPTIC ELECTRONIC SPECKLE PATTERN INTERFEROMETERS USING LASER-DIODE WAVELENGTH MODULATION [J].
ATCHA, H ;
TATAM, RP .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1994, 5 (06) :704-709
[2]  
BUTTERS JN, 1971, J MEAS CONTROL, V4, P349
[3]  
Davies J. C., 1993, OPTICAL METHODS ENG, P275
[4]  
DAVIES JC, 1987, P SOC PHOTO-OPT INS, V863, P194
[5]   ANALYSIS OF A DATA-BASED TV-HOLOGRAPHY SYSTEM USED TO MEASURE SMALL VIBRATION AMPLITUDES [J].
ELLINGSRUD, S ;
ROSVOLD, GO .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1992, 9 (02) :237-251
[6]   DIGITAL PHASE-MEASURING INTERFEROMETRY WITH A TUNABLE LASER DIODE [J].
ISHII, Y ;
CHEN, J ;
MURATA, K .
OPTICS LETTERS, 1987, 12 (04) :233-235
[7]   CONTRAST OF THE VIBRATION FRINGES IN TIME-AVERAGED ELECTRONIC SPECKLE-PATTERN INTERFEROMETRY - EFFECT OF SPECKLE AVERAGING [J].
JOENATHAN, C ;
KHORANA, BM .
APPLIED OPTICS, 1992, 31 (11) :1863-1870
[8]   VIBRATION FRINGES BY PHASE STEPPING ON AN ELECTRONIC SPECKLE PATTERN INTERFEROMETER - AN ANALYSIS [J].
JOENATHAN, C .
APPLIED OPTICS, 1991, 30 (32) :4658-4665
[9]  
Jones R., 1989, HOLOGRAPHIC SPECKLE, DOI DOI 10.1017/CBO9780511622465
[10]   VIBRATION PHASE MAPPING USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J].
LOKBERG, OJ ;
HOGMOEN, K .
APPLIED OPTICS, 1976, 15 (11) :2701-2704