X-Ray Fluorescence Determination of the Surface Density of Chromium Nanolayers

被引：0

作者：

Mashin, N. I. ^{[1
]}

Chernjaeva, E. A. ^{[1
]}

Tumanova, A. N. ^{[1
]}

Ershov, A. A. ^{[2
]}

机构：

[1] NI Lobachevskii Nizhnii Novgorod State Univ, Nizhnii Novgorod 603950, Russia

[2] Nizhnii Novgorod Res Inst Radiotechnol, Nizhnii Novgorod, Russia

来源：

JOURNAL OF APPLIED SPECTROSCOPY | 2014年 / 80卷 / 06期

关键词：

x-ray fluorescence analysis; thin-film thickness; amplification factor; mass absorption coefficient; substrate effect; polymer film substrate; K-ALPHA/K-BETA; SPECTROMETRY; MULTILAYERS; LAYERS;

D O I：

10.1007/s10812-014-9868-y

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

An auxiliary system consisting of thin-film layers of chromium deposited on a polymer film substrate is used to construct calibration curves for the relative intensities of the K (alpha) lines of chromium on bulk substrates of different elements as functions of the chromium surface density in the reference samples. Correction coefficients are calculated to take into account the absorption of primary radiation from an x-ray tube and analytical lines of the constituent elements of the substrate. A method is developed for determining the surface density of thin films of chromium when test and calibration samples are deposited on substrates of different materials.

引用

页码：934 / 938

页数：5

共 14 条

[1]

Bykov V. I., 1984, TAKING EFFECT SUBSTR

[2]

DAHL H, 1970, Z ANGEW PHYSIK, V29, P117

[3]

[Дудик Сергей Леонидович Dudik S.L.], 2006, [Аналитика и контроль, Analitika i kontrol'], V10, P282

[4]

Hirokava K., 1964, Z ANAL CHEM, V199, P89, DOI 10.1007/BF00566606

[5]

[Игнатова Юлия Александровна Ignatova Yu.A.], 2011, [Аналитика и контроль, Analitika i kontrol'], V15, P126

[6] Wavelength despersive spectroscopy analysis at high spectral resolution:: application to the study of Mo/Si multilayers [J].

Jonnard, Philippe ;

Maury, Helene ;

Andre, Jean-Michel .

X-RAY SPECTROMETRY, 2007, 36 (02) :72-75

[7] The density and tube energy dependency of cobalt Kα/Kβ in x-ray fluorescence spectrometry for thick target measurements [J].

Karimi, Minoo ;

Amiri, Nayereh ;

Ahadnejad, Vahid .

X-RAY SPECTROMETRY, 2008, 37 (05) :551-554

[8] Thickness measurement of coated Ni on brass plate using Kα/Kβ ratio by XRF spectrometry [J].

Karimi, Minoo ;

Amiri, Nayereh ;

Shabani, Amir Ali Tabbakh .

X-RAY SPECTROMETRY, 2009, 38 (03) :234-238

[9]

Mashin I., 2012, ZH PRIKL SPEKTROSK, V79, P857

[10]

[Машин Н.И. Mashin N.I.], 2011, [Журнал прикладной спектроскопии, Zhurnal prikladnoi spektroskopii], V78, P454

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