Thermal decay and erasure process for perpendicular recording at 1 Tb/in2

被引:8
作者
Gao, KZ [1 ]
Williams, M
Zhou, H
Fernandez-De-Castro, J
Bertram, HN
机构
[1] Seagate Technol, Bloomington, MN 55435 USA
[2] Hitachi Global Storage Technol, San Jose, CA 95120 USA
[3] Seagate Res, Pittsburgh, PA 15222 USA
[4] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA
关键词
erasure; perpendicular recording; thermal decay; tilted perpendicular recording; track edge effect;
D O I
10.1109/TMAG.2004.832674
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A micromagnetic Monte Carlo simulation is developed to stud.), the thermal decay and erasure process for perpendicular recording media. The switching probability is calculated based on both the energy barrier analysis and the master equation. The results show that for current head media combination at 1 Tb/in(2), the erasure is severe for the neighboring tracks unless the bit-aspect ratio is increased. The magnetic write width for both side shielded (SS) and no side shield (NSS) head is about the same. The erase band for the SS write head is significantly smaller (20 run less) than that for the NSS head, corresponding to 10 nm or 12% track pitch reduction.
引用
收藏
页码:2449 / 2451
页数:3
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