Vertical strain-induced dot size uniformity and thermal stability of InAs/GaAsN/GaAs coupled quantum dots

被引:4
作者
Biswas, Mahitosh [1 ]
Singh, Sandeep [1 ]
Balgarkashi, Akshay [1 ]
Makkar, Roshan [2 ]
Bhatnagar, Anuj [2 ]
Sreedhara, Sheshadri [3 ]
Chakrabarti, Subhananda [1 ]
机构
[1] Indian Inst Technol, Dept Elect Engn, Bombay 400076, Maharashtra, India
[2] Soc Appl Microwave Engn Elect & Res, Photon Div, IIT Powai Campus, Bombay 400076, Maharashtra, India
[3] Indian Inst Technol, Dept Mech Engn, Bombay 400076, Maharashtra, India
关键词
GaAsN; Coupled quantum dots; Dot size uniformity; Deep level defects; Local vibrational mode; Strain coupling; Thermal stability; NITROGEN BACKGROUND PRESSURE; GAAS;
D O I
10.1016/j.jallcom.2018.03.163
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We report, for the first time, 10-layer InAs/GaAsN/GaAs quantum dots (QDs) by varying the GaAs layer thickness and investigate their optical properties. Due to propagation of strain field from bottom to top, multiple stacking of self-assembled QDs helps special ordering of QDs on surface resulting in dot size uniformity. InAs coupled QDs with GaAsN/GaAs spacers of 2/10 nm exhibited a bimodal distribution with narrow linewidths and low As-related deep level defect peak intensity, attributable to good optical quality of QDs. N-like local vibrational mode in Raman spectroscopy was found to be consisted of ten oscillation fringes, possibly because of ten periods of GaAsN layer used in QD-heterostructures. Higher strain coupling resulted in lesser blue-shift with increasing annealing temperature as compared to the lower coupling, leading to thermal stability of coupled QDs. Coupled QDs exhibiting narrow linewidths and thermal stability could be employed in fabrication of photodetectors. (C) 2018 Elsevier B.V. All rights reserved.
引用
收藏
页码:601 / 607
页数:7
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