Hard x-ray photoemission study on strain effect in LaNiO3 thin films

被引：5

作者：

Yamagami, K. ^{[1
,2
]}

Ikeda, K. ^{[1
]}

Hariki, A. ^{[3
]}

Zhang, Y. ^{[4
]}

Yasui, A. ^{[5
]}

Takagi, Y. ^{[5
]}

Hotta, Y. ^{[4
]}

Katase, T. ^{[6
]}

Kamiya, T. ^{[6
]}

Wadati, H. ^{[1
,4
,7
]}

机构：

[1] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan

[2] Okinawa Inst Sci & Technol Grad Univ, Onna, Okinawa 9040495, Japan

[3] Osaka Prefecture Univ, Grad Sch Engn, Dept Phys & Elect, Sakai, Osaka 5998531, Japan

[4] Univ Hyogo, Grad Sch Mat Sci, Kamigori, Hyogo 6781297, Japan

[5] Japan Synchrotron Radiat Res Inst, Sayo, Hyogo 6795198, Japan

[6] Tokyo Inst Technol, Inst Innovat Res, Lab Mat & Struct, Midori Ku, Yokohama, Kanagawa 2268503, Japan

[7] Osaka Univ, Inst Laser Engn, Suita, Osaka 5650871, Japan

来源：

APPLIED PHYSICS LETTERS | 2021年 / 118卷 / 16期

基金：

日本科学技术振兴机构;

关键词：

PHOTOELECTRON ANGULAR-DISTRIBUTION; MEAN FREE PATHS; DISTRIBUTION PARAMETERS; METALLIC LANIO3; ELEMENTS; TRANSITIONS; NB;

D O I：

10.1063/5.0044047

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The strain effect from a substrate is an important experimental route to control electronic and magnetic properties in transition-metal oxide (TMO) thin films. Using hard x-ray photoemission spectroscopy, we investigate the strain dependence of the valence states in LaNiO3 thin films, strongly correlated perovskite TMO, grown on four substrates: LaAlO3, (LaAlO3)(0.3)(SrAl0.5Ta0.5O3)(0.7), SrTiO3, and DyScO3. A Madelung potential analysis of core-level spectra suggests that the point-charge description is valid for the La ions, while it breaks down for Ni and O ions due to a strong covalent bonding between the two. A clear x-ray photon-energy dependence of the valence spectra is analyzed by the density functional theory, which points to the presence of the La 5p state near the Fermi level.

引用

页数：6

共 58 条

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