Local atomic environment of Cu:CdTe thin film alloys

被引:8
作者
de León, JM
Espinosa, FJ
Pérez, VA
Jiménez-Sandoval, S
López-López, S
Montano, PA
机构
[1] CINVESTAV, Dept Fis Aplicada, Merida 97133, Yucatan, Mexico
[2] CINVESTAV, Lab Invest Mat, Queretaro 76001, Mexico
[3] CINVESTAV, Dept Fis, Mexico City 07000, DF, Mexico
[4] Argonne Natl Lab, Adv Photon Source, CAT, BESSRC, Argonne, IL 60439 USA
关键词
semiconductor alloys; solar cells; doping limits; local atomic structure;
D O I
10.1016/S0026-2692(00)00010-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have used X-ray absorption spectroscopy of the K-edge of each element in a Cd0.85Cu0.15Te thin film to investigate the local atomic structure around each constituent element. X-ray absorption near edge spectra reveal that the local electronic structure around Cd and Te atoms is similar to that of undoped CdTe, while that of Cu is different from that encountered in Cu metal. X-ray absorption fine structure spectra show that while the Cd near neighbor environment is similar to that of undoped CdTe, the Te environment shows differences compared with that found in undoped CdTe, consistent with Cu entering substitutionally for Cd. The Cu nearest neighbor environment suggests the presence of Cu-metal ligands characteristic of Cu metal clusters. These results imply the occurrence of microscopic phase separation in this material in variance with X-ray diffraction results that show a single crystalline phase. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:429 / 431
页数:3
相关论文
共 6 条
  • [1] Local phase separation in Tl-based oxide superconductors
    Conradson, SD
    DeLeon, JM
    Bishop, AR
    [J]. JOURNAL OF SUPERCONDUCTIVITY, 1997, 10 (04): : 329 - 332
  • [2] Doping limits in II-VI compounds - Challenges, problems and solutions
    Desnica, UV
    [J]. PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1998, 36 (04) : 291 - 357
  • [3] Observation of a photoinduced lattice relaxation in CdTe:In
    Espinosa, FJ
    de Leon, JM
    Conradson, SD
    Peña, JL
    Zapata-Torres, M
    [J]. PHYSICAL REVIEW LETTERS, 1999, 83 (17) : 3446 - 3449
  • [4] Direct observation of a lattice instability in heavily in-doped CdTe
    Espinosa, FJ
    deLeon, JM
    ZapataTorres, M
    CastroRodriguez, R
    Pena, JL
    Conradson, SD
    Hess, NJ
    [J]. PHYSICAL REVIEW B, 1997, 55 (12): : 7629 - 7632
  • [5] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL
    LEE, PA
    CITRIN, PH
    EISENBERGER, P
    KINCAID, BM
    [J]. REVIEWS OF MODERN PHYSICS, 1981, 53 (04) : 769 - 806
  • [6] RF sputtered CuxCd1-xTe thin films:: a novel semiconductor alloy
    Lopez-Lopez, S
    Jimenez-Sandoval, S
    Chao, BS
    Melendez-Lira, M
    [J]. COMPOUND SEMICONDUCTORS 1997, 1998, 156 : 61 - 64