Review Article: Overview of lanthanide pnictide films and nanoparticles epitaxially incorporated into III-V semiconductors

被引:23
作者
Bomberger, Cory C. [1 ]
Lewis, Matthew R. [1 ]
Vanderhoef, Laura R. [2 ]
Doty, Matthew F. [1 ,2 ]
Zide, Joshua M. O. [1 ]
机构
[1] Univ Delaware, Dept Mat Sci & Engn, Newark, DE 19716 USA
[2] Univ Delaware, Dept Phys & Astron, Newark, DE 19716 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2017年 / 35卷 / 03期
基金
美国国家科学基金会;
关键词
MOLECULAR-BEAM EPITAXY; ASSEMBLED ERAS ISLANDS; LIQUID-PHASE EPITAXY; RARE-EARTH ARSENIDES; ERBIUM-DOPED-GAAS; METALLIC NANOPARTICLES; TUNNEL-JUNCTIONS; ERP ISLANDS; GROWTH; TEMPERATURE;
D O I
10.1116/1.4979347
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The incorporation of lanthanide pnictide nanoparticles and films into III-V matrices allows for semiconductor composites with a wide range of potential optical, electrical, and thermal properties, making them useful for applications in thermoelectrics, tunnel junctions, phototconductive switches, and as contact layers. The similarities in crystal structures and lattice constants allow them to be epitaxially incorporated into III-V semiconductors with low defect densities and high overall film quality. A variety of growth techniques for these composites with be discussed, along with their growth mechanisms and current applications, with a focus on more recent developments. Results obtained from molecular beam epitaxy film growth will be highlighted, although other growth techniques will be mentioned. Optical and electronic characterization along with the microscopy analysis of these composites is presented to demonstrate influence of nanoinclusion composition and morphology on the resulting properties of the composite material. (C) 2017 Author(s).
引用
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页数:25
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