General theory of amplitude-modulation atomic force microscopy

被引：125

作者：

Lee, Manhee ^{[1
]}

Jhe, Wonho ^{[1
]}

机构：

[1] Seoul Natl Univ, Sch Phys & Astron, Seoul 151747, South Korea

来源：

PHYSICAL REVIEW LETTERS | 2006年 / 97卷 / 03期

关键词：

D O I：

10.1103/PhysRevLett.97.036104

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We present a general analytical theory that enables one to determine accurately the unknown tip-sample interactions from the experimental measurement of the amplitude and phase of the oscillating tip in amplitude-modulation atomic force microscopy (AM-AFM). We apply the method to the known Lennard-Jones-type forces and find excellent agreement with the reconstructed results. AM-AFM, widely used in air and liquid, is now not only an imaging tool but also a quantitative force measurement tool.

引用

页数：4

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