ELIMINATION OF THE DEPENDENCY OF THE CALIBRATION PLANE AND THE SAMPLE THICKNESS FROM COMPLEX PERMITTIVITY MEASUREMENTS OF THIN MATERIALS

被引：13

作者：

Hasar, U. C. ^{[1
,2
]}

Inan, O. E. ^{[3
]}

机构：

[1] Ataturk Univ, Dept Elect & Elect Engn, TR-25240 Erzurum, Turkey

[2] SUNY Binghamton, Dept Elect & Comp Engn, Binghamton, NY 13902 USA

[3] Microwave Elect Syst Inc MIKES, Dept Syst Engn, TR-06750 Ankara, Turkey

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2009年 / 51卷 / 07期

关键词：

microwave measurement; permittivity measurement; scatering parameters; AUTOMATIC NETWORK ANALYZER; MICROWAVE-FREQUENCIES; DIELECTRIC-CONSTANT; PERMEABILITY; BAND;

D O I：

10.1002/mop.24445

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In nonresonant broadband measurements, thin samples do not fill the entire sample holder (a waveguide or coaxial-line section). In this circumstance, the measured scattering parameters have to be the calibration plane to the sample end surfaces. Furthermore, it is always attractive to measure the complex permittivity of materials with no prior information of their thickness. This article, propose's a Simple bill powerful method it, eliminate the dependency of the calibration plane and Me sample thickness on permittivity measurements of thin nondispersive materials. (C) 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1642-1646, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24445

引用

页码：1642 / 1646

页数：5

共 49 条

[41] Thickness-Independent Permittivity Determination of Nondispersive or Weakly Dispersive Materials Using Amplitude-Only Transmission Measurements [J].

Hasar, Ugur Cem ;

Ali, Husain ;

Nayyeri, Vahid ;

Ramahi, Omar M. .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2025, 74

[42] COMPLEX PERMITTIVITY DETERMINATION OF LOSSY MATERIALS AT MILLIMETER AND TERAHERTZ FREQUENCIES USING FREE-SPACE AMPLITUDE MEASUREMENTS [J].

Hasar, U. C. ;

Ozbek, I. Y. .

JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 2011, 25 (14-15) :2100-2109

[43] Permittivity characterization of low-k thin films from transmission-line measurements [J].

Janezic, MD ;

Williams, DF ;

Blaschke, V ;

Karamcheti, A ;

Chang, CS .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (01) :132-136

[44] UNIQUE PERMITTIVITY DETERMINATION OF LOW-LOSS DIELECTRIC MATERIALS FROM TRANSMISSION MEASUREMENTS AT MICROWAVE FREQUENCIES [J].

Hasar, U. C. .

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2010, 107 :31-46

[45] Measurements of the Complex Permittivity of Low Loss Polymers at Frequency Range From 5 GHz to 50 GHz [J].

Krupka, Jerzy .

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2016, 26 (06) :464-466

[46] A METRIC FUNCTION FOR FAST AND ACCURATE PERMITTIVITY DETERMINATION OF LOW-TO-HIGH-LOSS MATERIALS FROM REFLECTION MEASUREMENTS [J].

Hasar, U. C. ;

Oral, E. A. .

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2010, 107 :397-412

[47] Broadband Complex Permittivity Measurements of Thin Sheets Using TE0n1 Modes in a Split-Cylinder Resonator [J].

Yu, Chengyong ;

Ran, Xuan ;

Zhang, Yunpeng ;

Gao, Chong ;

Gao, Yong ;

Long, Jiawei ;

Zhang, Zhuoyue ;

He, Xiao ;

Li, En .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2024, 72 (07) :4114-4126

[48] Electromagnetic Characterization of Thin Dielectric Materials From Amplitude-Only Measurements [J].

Hasar, Ugur Cem ;

Bute, Musa .

IEEE SENSORS JOURNAL, 2017, 17 (16) :5093-5103

[49] REFERENCE-PLANE INVARIANT, BROADBAND, AND STABLE CONSTITUTIVE PARAMETERS DETERMINATION OF LOW-LOSS MATERIALS FROM TRANSMISSION-REFLECTION MEASUREMENTS USING VARIABLE PARAMETERS [J].

Hasar, U. C. .

JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 2012, 26 (01) :44-53

← 1 2 3 4 5 →