ELIMINATION OF THE DEPENDENCY OF THE CALIBRATION PLANE AND THE SAMPLE THICKNESS FROM COMPLEX PERMITTIVITY MEASUREMENTS OF THIN MATERIALS

被引：13

作者：

Hasar, U. C. ^{[1
,2
]}

Inan, O. E. ^{[3
]}

机构：

[1] Ataturk Univ, Dept Elect & Elect Engn, TR-25240 Erzurum, Turkey

[2] SUNY Binghamton, Dept Elect & Comp Engn, Binghamton, NY 13902 USA

[3] Microwave Elect Syst Inc MIKES, Dept Syst Engn, TR-06750 Ankara, Turkey

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2009年 / 51卷 / 07期

关键词：

microwave measurement; permittivity measurement; scatering parameters; AUTOMATIC NETWORK ANALYZER; MICROWAVE-FREQUENCIES; DIELECTRIC-CONSTANT; PERMEABILITY; BAND;

D O I：

10.1002/mop.24445

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In nonresonant broadband measurements, thin samples do not fill the entire sample holder (a waveguide or coaxial-line section). In this circumstance, the measured scattering parameters have to be the calibration plane to the sample end surfaces. Furthermore, it is always attractive to measure the complex permittivity of materials with no prior information of their thickness. This article, propose's a Simple bill powerful method it, eliminate the dependency of the calibration plane and Me sample thickness on permittivity measurements of thin nondispersive materials. (C) 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1642-1646, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24445

引用

页码：1642 / 1646

页数：5

共 47 条

[31] Simple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency band [J].

Hasar, U. C. ;

Barroso, J. J. ;

Kaya, Y. ;

Bute, M. ;

Ertugrul, M. .

JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 2014, 28 (08) :903-915

[32] A broadband variable-temperature test system for complex permittivity measurements of solid and powder materials [J].

Zhang, Yunpeng ;

Li, En ;

Zhang, Jing ;

Yu, Chengyong ;

Zheng, Hu ;

Guo, Gaofeng .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 89 (02)

[33] A new approach to estimate complex permittivity of dielectric materials at microwave frequencies using waveguide measurements [J].

Deshpande, MD ;

Reddy, CJ ;

Tiemsin, PI ;

Cravey, R .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1997, 45 (03) :359-366

[34] Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements [J].

Hasar, Ugur Cem ;

Kaya, Yunus ;

Ozturk, Hamdullah ;

Izginli, Mucahit ;

Barroso, Joaquim Jose ;

Ramahi, Omar M. ;

Ertugrul, Mehmet .

IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, 2022, 60

[35] THICKNESS-INDEPENDENT AUTOMATED CONSTITUTIVE PARAMETERS EXTRACTION OF THIN SOLID AND LIQUID MATERIALS FROM WAVEGUIDE MEASUREMENTS [J].

Hasar, U. C. .

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2009, 92 :17-32

[36] PERMITTIVITY MEASUREMENT OF THIN DIELECTRIC MATERIALS FROM REFLECTION-ONLY MEASUREMENTS USING ONE-PORT VECTOR NETWORK ANALYZERS [J].

Hasar, U. C. .

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2009, 95 :365-380

[37] In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band:: Theory (Part I) [J].

Sagnard, F ;

Bentabet, F ;

Vignat, C .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (03) :1266-1273

[38] In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band:: Experiments (Part II) [J].

Sagnard, F ;

Bentabet, F ;

Vignat, C .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (03) :1274-1282

[39] Thickness-Independent Permittivity Determination of Nondispersive or Weakly Dispersive Materials Using Amplitude-Only Transmission Measurements [J].

Hasar, Ugur Cem ;

Ali, Husain ;

Nayyeri, Vahid ;

Ramahi, Omar M. .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2025, 74

[40] COMPLEX PERMITTIVITY DETERMINATION OF LOSSY MATERIALS AT MILLIMETER AND TERAHERTZ FREQUENCIES USING FREE-SPACE AMPLITUDE MEASUREMENTS [J].

Hasar, U. C. ;

Ozbek, I. Y. .

JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, 2011, 25 (14-15) :2100-2109

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