ELIMINATION OF THE DEPENDENCY OF THE CALIBRATION PLANE AND THE SAMPLE THICKNESS FROM COMPLEX PERMITTIVITY MEASUREMENTS OF THIN MATERIALS

被引：13

作者：

Hasar, U. C. ^{[1
,2
]}

Inan, O. E. ^{[3
]}

机构：

[1] Ataturk Univ, Dept Elect & Elect Engn, TR-25240 Erzurum, Turkey

[2] SUNY Binghamton, Dept Elect & Comp Engn, Binghamton, NY 13902 USA

[3] Microwave Elect Syst Inc MIKES, Dept Syst Engn, TR-06750 Ankara, Turkey

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2009年 / 51卷 / 07期

关键词：

microwave measurement; permittivity measurement; scatering parameters; AUTOMATIC NETWORK ANALYZER; MICROWAVE-FREQUENCIES; DIELECTRIC-CONSTANT; PERMEABILITY; BAND;

D O I：

10.1002/mop.24445

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In nonresonant broadband measurements, thin samples do not fill the entire sample holder (a waveguide or coaxial-line section). In this circumstance, the measured scattering parameters have to be the calibration plane to the sample end surfaces. Furthermore, it is always attractive to measure the complex permittivity of materials with no prior information of their thickness. This article, propose's a Simple bill powerful method it, eliminate the dependency of the calibration plane and Me sample thickness on permittivity measurements of thin nondispersive materials. (C) 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1642-1646, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24445

引用

页码：1642 / 1646

页数：5

共 49 条

[21] Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements [J].

Hasar, Ugur Cem ;

Barroso, Joaquim Jose ;

Kaya, Yunus ;

Ertugrul, Mehmet ;

Bute, Musa ;

Catala-Civera, Jose M. .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2014, 116 (04) :1701-1710

[22] Extraction of Stable Complex Permittivity and Permeability of Low-Loss Materials From Transmission/Reflection Measurements [J].

Yang, Chuang ;

Huang, Hui .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 70

[23] Complex Permittivity Measurements of Film-Type Materials: Effect of the Waveguide Flange [J].

Lee, Han-Hee ;

Yoon, Sang Wook ;

Lee, Jae Wook .

IEEE ACCESS, 2025, 13 :36388-36400

[24] Microwave method for reference-plane-invariant and thickness-independent permittivity determination of liquid materials [J].

Hasar, U. C. ;

Kaya, Y. ;

Bute, M. ;

Barroso, J. J. ;

Ertugrul, M. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (01)

[25] ESTIMATING ERRORS DUE TO SAMPLE SURFACE-ROUGHNESS IN MICROWAVE COMPLEX PERMITTIVITY MEASUREMENTS OBTAINED USING A COAXIAL PROBE [J].

ARAI, M ;

BINNER, JGP .

ELECTRONICS LETTERS, 1995, 31 (02) :115-117

[26] Measurements to estimate the relative permittivity and loss tangent of thin, low-loss materials [J].

Mahony, JD .

IEEE ANTENNAS AND PROPAGATION MAGAZINE, 2005, 47 (03) :83-87

[27] Unique Retrieval of Complex Permittivity of Low-Loss Dielectric Materials From Transmission-Only Measurements [J].

Hasar, Ugur Cem .

IEEE GEOSCIENCE AND REMOTE SENSING LETTERS, 2011, 8 (03) :562-564

[28] Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials [J].

Hasar, Ugur C. ;

Kaya, Yunus ;

Barroso, Joaquim Jose ;

Ertugrul, Mehmet .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2015, 63 (07) :2313-2321

[29] A test system for complex permittivity measurements of low-loss materials at high temperatures up to 2000°C [J].

Guo, Gaofeng ;

Li, En ;

Li, Zhongping ;

Zhang, Qishao ;

He, Fengmei .

MEASUREMENT SCIENCE AND TECHNOLOGY, 2011, 22 (04)

[30] Free-space Measurement Using Explicit, Reference-plane and Thickness-invariant Method for Permittivity Determination of Planar Materials [J].

You, Kok Yeow ;

Sim, Man Seng ;

Mutadza, Hafizah ;

Esa, Fahmiruddin ;

Chan, Yi Lin .

2017 PROGRESS IN ELECTROMAGNETICS RESEARCH SYMPOSIUM - FALL (PIERS - FALL), 2017, :222-228

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