ELIMINATION OF THE DEPENDENCY OF THE CALIBRATION PLANE AND THE SAMPLE THICKNESS FROM COMPLEX PERMITTIVITY MEASUREMENTS OF THIN MATERIALS

被引：13

作者：

Hasar, U. C. ^{[1
,2
]}

Inan, O. E. ^{[3
]}

机构：

[1] Ataturk Univ, Dept Elect & Elect Engn, TR-25240 Erzurum, Turkey

[2] SUNY Binghamton, Dept Elect & Comp Engn, Binghamton, NY 13902 USA

[3] Microwave Elect Syst Inc MIKES, Dept Syst Engn, TR-06750 Ankara, Turkey

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2009年 / 51卷 / 07期

关键词：

microwave measurement; permittivity measurement; scatering parameters; AUTOMATIC NETWORK ANALYZER; MICROWAVE-FREQUENCIES; DIELECTRIC-CONSTANT; PERMEABILITY; BAND;

D O I：

10.1002/mop.24445

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In nonresonant broadband measurements, thin samples do not fill the entire sample holder (a waveguide or coaxial-line section). In this circumstance, the measured scattering parameters have to be the calibration plane to the sample end surfaces. Furthermore, it is always attractive to measure the complex permittivity of materials with no prior information of their thickness. This article, propose's a Simple bill powerful method it, eliminate the dependency of the calibration plane and Me sample thickness on permittivity measurements of thin nondispersive materials. (C) 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1642-1646, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24445

引用

页码：1642 / 1646

页数：5

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