Luminescence flashes induced by microwave radiation in undoped GaAs quantum wells

被引:4
作者
Baskin, I. [1 ]
Ashkinadze, B. M. [1 ]
Cohen, E. [1 ]
Pfeiffer, L. N. [2 ]
机构
[1] Technion Israel Inst Technol, Inst Solid State, IL-32000 Haifa, Israel
[2] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
关键词
aluminium compounds; electron traps; excitons; gallium arsenide; hole traps; III-V semiconductors; localised states; photoconductivity; photoexcitation; photoluminescence; semiconductor quantum wells; spectral line intensity; CYCLOTRON-RESONANCE; ELECTRIC-FIELD; SEMICONDUCTORS; PHOTOLUMINESCENCE; EXCITONS; CARRIERS; KINETICS; STORAGE; HOLES;
D O I
10.1103/PhysRevB.79.195325
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Bright flashes of exciton emission are observed in photoexcited, undoped GaAs/AlGaAs quantum wells under pulsed microwave (36 GHz) irradiation. The flash intensity is in the range of 10-100 times the steady-state photoluminescence intensity with a decay time of (1-10)x10(-8) s (depending on the applied microwave power and photoexcitation). These observations indicate a reservoir of long-lived carriers that is formed at low temperature due to localization of photogenerated electrons and holes at spatially separated shallow traps. Microwave-heated electrons activate the localized carriers into free states by means of avalanche impact ionization. This gives rise to rapid exciton formation with subsequent luminescence flash. A detailed model based on the coupled rate equations for free electrons, excitons and localized electrons (holes) is presented.
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页数:5
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