Microscopical Investigations of PEDOT:PSS Thin Films

被引:408
|
作者
Lang, Udo [1 ]
Mueller, Elisabeth [2 ]
Naujoks, Nicola [3 ]
Dual, Jurg [1 ]
机构
[1] Inst Mech Syst, Dept Mech & Proc Engn, CH-8092 Zurich, Switzerland
[2] Elect Microscopy ETH Zurich EMEZ, CH-8093 Zurich, Switzerland
[3] ETH, Dept Mech & Proc Engn, Nanotechnol Grp, CH-8092 Zurich, Switzerland
关键词
POLY(3,4-ETHYLENE DIOXYTHIOPHENE)-POLY(STYRENE SULFONATE); PHOTOELECTRON-SPECTROSCOPY; X-RAY; PSS; CONDUCTIVITY; MORPHOLOGY;
D O I
10.1002/adfm.200801258
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Electron microscopy studies are used to explore the morphology of thin poly(3,4-ethylenedioxythiophene) and polystyrene sulfonate acid (PEDOT PSS) films. The figures show that the films are composed of grains with diameters in the range of about 50 nm. Energy dispersive X-ray spectroscopy analysis reveals that individual grains have a PEDOT-rich core and a PSS-rich shell with a thickness of about 5-10 nm. Atomic force microscopy (AFM) is then used to analyze the topography of fracture surfaces of ruptured PEDOT PSS tensile specimens. These AFM scans also show that the films are composed of grains dispersed in a matrix. The investigations presented herein yield a picture of PEDOT PSS morphology with unprecedented clarity.
引用
收藏
页码:1215 / 1220
页数:6
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