Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: Development of a novel sample-holder

被引：13

作者：

Cheynis, F. ^{[1
]}

Leroy, F. ^{[1
]}

Ranguis, A. ^{[1
]}

Detailleur, B. ^{[1
]}

Bindzi, P. ^{[1
]}

Veit, C. ^{[1
]}

Bon, W. ^{[1
]}

Mueller, P. ^{[1
]}

机构：

[1] Aix Marseille Univ, CNRS, CINaM UMR 7325, F-13288 Marseille, France

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2014年 / 85卷 / 04期

关键词：

TUNNELING-MICROSCOPY; AU(111); RECONSTRUCTION; DIFFRACTION;

D O I：

10.1063/1.4871437

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We introduce an experimental facility dedicated to surface science that combines Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy (LEEM/PEEM) and variable-temperature Scanning Probe Microscopy techniques. A technical challenge has been to design a sample-holder that allows to exploit the complementary specifications of both microscopes and to preserve their optimal functionality. Experimental demonstration is reported by characterizing under ultrahigh vacuum with both techniques: Au(111) surface reconstruction and a two-layer thick graphene on 6H-SiC(0001). A set of macros to analyze LEEM/PEEM data extends the capabilities of the setup. (C) 2014 AIP Publishing LLC.

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页数：5

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